The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Apr. 03, 2012
Applicant:

Hidetaka Fukudome, Kusatsu, JP;

Inventor:

Hidetaka Fukudome, Kusatsu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01K 3/10 (2006.01); H01R 43/00 (2006.01); H05K 3/00 (2006.01); H05K 3/36 (2006.01); H01G 4/30 (2006.01); H01L 27/108 (2006.01); H01L 29/94 (2006.01); H01G 4/12 (2006.01); H01G 4/232 (2006.01); H01L 23/50 (2006.01);
U.S. Cl.
CPC ...
H01G 4/12 (2013.01); H01G 4/232 (2013.01); H01G 4/30 (2013.01); H01L 23/50 (2013.01); H01L 2224/16225 (2013.01); H01L 2924/3011 (2013.01); Y10T 29/435 (2015.01); Y10T 29/49165 (2015.01); Y10T 29/49204 (2015.01);
Abstract

In a method for manufacturing a monolithic ceramic electronic component, when an inner conductor is formed by printing an electrically conductive paste, a smear may be generated in an opening of the inner conductor at a side of the opening near to a position from which printing is started in a printing direction. The smear may cause an unwanted contact between the inner conductor and a via conductor, which is a conductor extending through the opening and having a potential different from that of the inner conductor, so as to cause a short-circuit. The inner conductor is printed such that the center of each via conductor is deviated from the center of the opening in the direction in which the electrically conductive paste is printed. With this structure, even if the smear is generated in the opening, the probability of a short-circuit is minimized.


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