The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Mar. 28, 2012
Naofumi Mirumachi, Saitama, JP;
Masataka Takahashi, Matsudo, JP;
Naofumi Mirumachi, Saitama, JP;
Masataka Takahashi, Matsudo, JP;
LAUREL PRECISION MACHINES CO., LTD., Osaka-shi, Osaka, JP;
Abstract
A subject discriminating apparatus discriminates a subject having an unevenness pattern on a surface of the subject. The subject discriminating apparatus includes: a transparent unit including a supporting surface supporting the subject; a light irradiation unit irradiating illumination light onto the surface of the subject through the transparent unit; an imaging unit imaging an imaging region including at least a part of the transparent unit, and generating image data; and a discrimination processing unit discriminating the subject, using the image data generated by the imaging unit. The discrimination processing unit discriminates the subject based on discrimination image data generated by correcting subject image data using correction image data. The subject image data is generated by imaging the imaging region in a state of the subject presenting in the imaging region. The correction image data is generated by imaging the imaging region free from the subject in the imaging region.