The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Jul. 12, 2007
Applicants:

Fred Warner Sixt, Jr., Carlsbad, CA (US);

Satish N. Ram, Poway, CA (US);

Inventors:

Fred Warner Sixt, Jr., Carlsbad, CA (US);

Satish N. Ram, Poway, CA (US);

Assignee:

OMNITRACS, LLC, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G07C 5/08 (2006.01); G07C 3/00 (2006.01); G07C 5/00 (2006.01);
U.S. Cl.
CPC ...
G07C 5/085 (2013.01); G07C 3/00 (2013.01); G07C 5/008 (2013.01);
Abstract

A wireless equipment management system that is configured to track sensors for work measurement for predetermined events. The sensors are configured to measure event durations of a specific piece of equipment as defined by a user and sent to a Network Management Center. This enables the user to measure work times by configuring work events as sensor input events. The event durations can be displayed and reports can be produced at the Network Management Center.


Find Patent Forward Citations

Sixt, Jr., Fred. (2016). Apparatus and method for measuring operational data for equipment using sensor breach durations (U.S. Patent No. 9235938). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9235938

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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