The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Mar. 14, 2013
Juan C. Ramirez Giraldo, Chapel Hill, NC (US);
Cynthia H. Mccollough, Byron, MN (US);
Juan C. Ramirez Giraldo, Chapel Hill, NC (US);
Cynthia H. McCollough, Byron, MN (US);
Other;
Abstract
A system and method is provided for reducing partial scan reconstruction artifacts in sinogram data acquired as a series of sets of partial-scan projection views, each set of projection views extending over an angular range of less than 360 degrees. A full-scan sinogram matrix for each of the sets of projection views in the series is created and each set of partial-scan projection views is stored in a respective full-scan sinogram matrix to create an array of full-scan matrices having respective empty spaces not filled by partial-scan projection view data stored therein. The empty spaces are filled in each of the full-scan sinogram matrices using the partial-scan projection view data stored therein and an image of the subject is reconstructed from the full-scan sinogram matrices having the empty spaces filled using the partial-scan projection view data stored therein.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile