The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Jan. 02, 2013
Vascuvis Inc., Wenham, MA (US);
Rutgers, the State University of New Jersey, New Brunswick, NJ (US);
Trustees of Boston University, Boston, MA (US);
The Trustees of the University of Pennsylvania, Philadelphia, PA (US);
Andrew Buckler, Wenham, MA (US);
Anant Madabhushi, Beachwood, OH (US);
James Hamilton, Boston, MA (US);
Shannon Agner, Cherry Hlll, NJ (US);
Mark Rosen, Bala Cynwyd, PA (US);
Elucid Bioimaging, Inc., Wenham, MA (US);
Rutgers, The State University of New Jersey, New Brunswick, NJ (US);
Trustees of Boston University, Boston, MA (US);
The Trustees of the University of Pennsylvania, Philadelphia, PA (US);
Abstract
A method and apparatus for classifying possibly vulnerable plaques from sets of DCE-MRI images includes receiving a set of MRI slice images obtained at respectively different times, where each slice image includes voxels representative of at least one region of interest (ROI). The images are processed to determine the boundaries of the ROIs and the voxels within the identified boundaries in corresponding regions of the images from each time period are processed to extract kinetic texture features. The kinetic texture features are then used in a classification process which classifies the ROIs as vulnerable or stable.