The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Aug. 22, 2012
Applicants:

Yoshikazu Ogasawara, Kagawa, JP;

Miwa Iida, Kagawa, JP;

Inventors:

Yoshikazu Ogasawara, Kagawa, JP;

Miwa Iida, Kagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); A61F 13/15 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); A61F 13/15658 (2013.01); A61F 13/15772 (2013.01); A61F 2013/1578 (2013.01);
Abstract

An inspecting apparatus is provided which inspects whether or not a liquid absorbent particulate is deposited with a predetermined deposition pattern on an absorbent sheet-like member, the absorbent sheet-like member having a continuous web and a plurality of absorbent bodies, the continuous web being transported along a transport direction, the absorbent bodies being formed on one surface of the continuous web in a spaced apart manner in the transport direction, each absorbent body including the liquid absorbent particulate as a main material. The inspecting apparatus includes: an imaging process section which is adapted to image, from one side of a surface of the absorbent sheet-like member, a region on the absorbent sheet-like member where the absorbent body is expected to exist, and that is adapted to produce data relating to a planar image of the region as planar image data of the absorbent body; an extracting process section which is adapted to extract a proper quantity region from the planar image by performing a binarization process on the produced planar image data based on a threshold value, the proper quantity region being an imaged region in which the liquid absorbent particulate is of a specified amount or more; and a pass/fail determination process section that is adapted to perform a pass/fail determination process based on a value indicating a size of the proper quantity region.


Find Patent Forward Citations

Loading…