The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Jun. 29, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Hai Qian, San Mateo, CA (US);
Rahul Iyer, Foster City, CA (US);
Shengwen Yang, Beijing, CN;
Caleb E. Welton, Foster City, CA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06N 5/02 (2006.01); G06N 7/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06K 9/6256 (2013.01); G06N 5/025 (2013.01); G06N 7/005 (2013.01);
Abstract
A general framework for cross-validation of any supervised learning algorithm on a distributed database comprises a multi-layer software architecture that implements training, prediction and metric functions in a C++ layer and iterates processing of different subsets of a data set with a plurality of different models in a Python layer. The best model is determined to be the one with the smallest average prediction error across all database segments.