The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Dec. 09, 2013
Samsung Electronics Co., Ltd, Suwon-si, Gyeonggi-do, KR;
Zhu Li, Plano, TX (US);
Xin Xin, Bellevue, WA (US);
Abhishek Nagar, Garland, TX (US);
Gaurav Srivastava, Dallas, TX (US);
Kong Posh Bhat, Plano, TX (US);
Felix Carlos Fernandes, Plano, TX (US);
SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;
Abstract
To improve feature selection accuracy during a visual search, interest points within a query image are two-way matched to features in an affine transformed image or otherwise transformed version of the query image. A user device implements a method for selecting local descriptors in the visual search. The method includes: detecting a first set of interest points for the original image; computing an affine transform matrix; computing a new image as a transformation of the original image using the affine transform matrix; detecting a second set of interest points from the and new image; performing a two-way matching between the first set of interest points and the second set of interest points; sorting matching pairs according to a specified self-matching score (SMS); assigning an infinite value to SMS of unmatched interest points from the original image; selecting the interest points based on SMS. Significant performance gains reduce false positive matches.