The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Jun. 30, 2011
Applicants:

Christopher Jones, San Francisco, CA (US);

Daren Desjardins, San Francisco, CA (US);

Eric Bothwell, San Francisco, CA (US);

Alexander Fontana, San Francisco, CA (US);

Inventors:

Christopher Jones, San Francisco, CA (US);

Daren Desjardins, San Francisco, CA (US);

Eric Bothwell, San Francisco, CA (US);

Alexander Fontana, San Francisco, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30572 (2013.01);
Abstract

A method and apparatus for automatically correlating policy violation incidents. In one embodiment, the method includes receiving user input identifying one of policy violation incidents stored in a data repository, where each policy violation incident is associated with one or more attributes. The method further includes automatically correlating the identified policy violation incident with other policy violation incidents that have in common at least one attribute with the identified policy violation incident, and presenting the resulting correlation information to a user.


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