The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Jan. 21, 2011
Yoshihiro Kanna, Tokyo, JP;
Yoshihiro Kanna, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A load information acquiring unit () sets load information based on the history that is acquired by a process history acquiring unit (). A test period determining unit () sets a test period based on the load information. The test period is a period during which a test policy can be used. The test policy is a policy for a test out of control policies used by an information processing system (). A system control unit () measures performance capability of the information processing system () under the test policy as a test result by testing the test policy under a production environment of the information processing system () by using the test policy instead of a practical policy that is actually used in the test period. A policy changing unit () changes the practical policy based on the test policy in a range in which the test result satisfies a reference.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile