The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
May. 30, 2014
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Yu-Kai Xiong, Shenzhen, CN;
Xin Lu, Shenzhen, CN;
Yu-Yong Zhang, Shenzhen, CN;
Huan-Huan Zhang, Shenzhen, CN;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A testing scheduling system for optimizing and scheduling a testing path among a plurality of available work station calculates a distance between work stations according to the coordinates of the of the available work stations, assigns a value to a quantity, and applies this to the failure rate of each work station, the backlog quantities of each work station, the test-awaited quantities, and the distances between each available work station to acquire a failure rate value, a backlog quantities value, a test-awaited quantities value, and a distances value. The testing scheduling system further calculates a first weighted value of each available work station by summing the failure rate value, the backlog quantities value, the test-awaited quantities value, and the distances value of each available work station, and analyzes the first weighted values to determine a preferred work station.