The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9235463 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 12, 2016

Filed:

Sep. 16, 2013
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Yong-Hyuk Moon, Daejeon, KR;

Jeong-Nyeo Kim, Daejeon, KR;

Bo-Heung Chung, Daejeon, KR;

Jin-Hee Han, Daejeon, KR;

Dae-Won Kim, Daejeon, KR;

Hwa-Shin Moon, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); H04L 12/24 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0748 (2013.01); G06F 11/0793 (2013.01); G06F 11/3452 (2013.01); H04L 41/0631 (2013.01); G06F 11/3409 (2013.01); H04L 41/0883 (2013.01);
Abstract

There is provided a method of fault management of a smart device including comparing a value of a fault detection indicator (hereinafter referred to as 'FDI') in a normal state, which detects faults generated in the smart device, with respect to at least one performance indicator, with an FDI value observed in real time and detecting the faults by calculating a relative variation level of the observed values, and creating a diagnosis object (hereinafter referred to as 'DO') including a cause and a countermeasure of the detected fault and analyzing the fault.


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Moon, Yong-Hyuk. (2016). Device and method for fault management of smart device (U.S. Patent No. 9235463). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9235463

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