The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Aug. 03, 2005
William Macdonald, Mansfield, TX (US);
George Logsdon, Arlington, TX (US);
Matthew Lascom, Arlington, TX (US);
Steven Craig Gessler, Arlington, TX (US);
William MacDonald, Mansfield, TX (US);
George Logsdon, Arlington, TX (US);
Matthew Lascom, Arlington, TX (US);
Steven Craig Gessler, Arlington, TX (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
In semiconductor wafer manufacturing, processes such as analyzing test data associated with semiconductor wafers, interpreting the test data analysis, and acting on the test data interpretation and analysis are automated. Such automation can eliminate delays that were previously imposed by the action of test analysis engineers and wafer fabrication personnel, thereby reducing the amount of useless material that is produced before a process defect can be detected.