The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Oct. 23, 2013
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Robert H. Grubbs, South Pasadena, CA (US);
Raymond Weitekamp, Glendale, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/04 (2006.01); G02B 5/30 (2006.01); H01L 51/00 (2006.01); G02B 1/08 (2006.01); G02B 1/10 (2015.01); H01L 51/05 (2006.01);
U.S. Cl.
CPC ...
G02B 1/04 (2013.01); G02B 1/08 (2013.01); G02B 1/10 (2013.01); G02B 5/3083 (2013.01); H01L 51/0041 (2013.01); H01L 51/0579 (2013.01); Y02E 10/549 (2013.01);
Abstract
The disclosure describes a polymer brush structure exhibiting birefringence, said polymer brush structure comprising a plurality of substantially parallel oriented polymers and characterized by a longitudinal z-direction having a first refractive index, n, and a lateral x,y-direction having a second refractive index, n, wherein the difference, Δn, between the first refractive index and the second refractive index is in a range of about 0.1 to about 0.6, as measured by ellipsometry and fit to a Cauchy analytical model.