The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Apr. 24, 2012
Eduard Batkilin, Nesher, IL;
Irina Karelin, Haifa, IL;
Alex Feldman, Nofit, IL;
GENERIC IMAGING LTD, Nesher, IL;
Abstract
System and method for linearization of photometric response of an imaging sensor of a multi-camera flat panel X-Ray detector. The linearization includes acquiring by the imaging sensor, during a linearization phase, at least two images related to detectable radiation radiated by a scintillator in response to X-Ray radiation generated by an X-Ray source at a field of view of the imaging sensor, wherein the intensity of the X-Ray radiation generated by the X-Ray source is different for each of the images, measuring by a light energy measurement unit, substantially simultaneously with the acquiring of each of the images, at least two corresponding levels of energy of the detectable radiation, wherein the light energy measurement unit is substantially linear at the range of operation, and calculating an inverse response function to the imaging sensor based on the images and on the corresponding levels of energy.