The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Mar. 14, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Eriko Sugawara, Honjo, JP;
Toshio Kameshima, Kumagaya, JP;
Tomoyuki Yagi, Honjo, JP;
Katsuro Takenaka, Honjo, JP;
Sho Sato, Saitama, JP;
Atsushi Iwashita, Honjo, JP;
Hideyuki Okada, Honjo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A radiation imaging apparatus including pixels; driving lines; a driving circuit; bias lines; an acquisition unit configured to acquire an evaluation value based on a current flowing in the bias line; a determination unit configured to compare the evaluation value with a comparison target value to determine whether radiation is irradiated; a control unit configured to control the acquisition unit and the determination unit; and a storage unit configured to store the evaluation value used in the determination process, is provided. A comparison target value used in a given determination process is based on one or more evaluation values used in one or more determination processes which are performed before the given determination process and in which it is determined that radiation has not been irradiated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile