The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Sep. 21, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Anuja Banerjee, San Jose, CA (US);

Samy R. Makar, Fremont, CA (US);

Vijay M. Bettada, Fremont, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318594 (2013.01);
Abstract

A method and apparatus for conducting a transition test of a source synchronous interface is disclosed. A system includes a source synchronous transmitter and source synchronous receiver. The source synchronous transmitter includes a first scannable flop having an output coupled to a data input of a second scannable flop in the source synchronous receiver. During a transition test, the source synchronous transmitter is configured to transmit data from the first scannable flop to the second scannable flop, along with a clock signal at an operational clock speed. The first scannable flop is coupled to feedback circuitry configured to cause transitions of the transmitted data. The second scannable flop may capture the transmitted data. The captured data may be subsequently used to determine if the desired transitions were detected by the second scannable flop.


Find Patent Forward Citations

Loading…