The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Apr. 01, 2014
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Inventors:

Yuki Iwagami, Tokyo, JP;

Susumu Tanaka, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318544 (2013.01); G01R 31/31724 (2013.01); G01R 31/318555 (2013.01);
Abstract

There is provided a low-cost electronic control unit that is capable of performing its hardware check every start and stop of the electronic control unit. A monitoring and control circuit section that is an integrated circuit element built in the electronic control unit includes a self-test circuit configured with a built-in self-test control block, scan chain circuits and mask circuitry, and performs a self-test using the built-in self-test control block and a partial combination of the scan chain circuits at start of the operation. In the shipment inspection of the integrated circuit element alone, an external test is performed by a checker microprocessor using an entire combination of the scan chain circuits. Thus, the electronic control unit of low-cost configuration is capable of performing a scan test by making use of part of the scan chain circuits designed for the component inspection.


Find Patent Forward Citations

Loading…