The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Mar. 13, 2013
David E. Minkler, Campbell, CA (US);
Michael G. Konicek, Santa Clara, CA (US);
David E. Minkler, Campbell, CA (US);
Michael G. Konicek, Santa Clara, CA (US);
Thermo Finnigan LLC, San Jose, CA (US);
Abstract
This technology is directed to a method and apparatus for monitoring or testing defects associated with an ion lens connected within a mass spectrometer. In some implementations, the testing mechanism monitors a connection of one or more ion lenses configured in the mass spectrometer to determine if voltage is effectively applied to the ion lens. The testing circuit of the present technology includes at least one Zener diode added to the voltage divider and monitoring a change in slope of the applied voltage versus the voltage at the read-back circuit. The change in slope may be easily measured.