The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Jun. 10, 2013
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Seong-Ook Park, Daejeon, KR;

Byeong Yong Park, Daejeon, KR;

Myung Hun Jeong, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2658 (2013.01);
Abstract

Provided are an apparatus and method for measuring a dielectric constant. The apparatus includes a cavity resonator including a cavity therein, an insertion hole penetrating through the cavity vertically and in which a sample is inserted, and grooves symmetrically formed with respect to the cavity in the insertion hole, a network analyzer configured to generate an electromagnetic signal supplied to the cavity resonator, receive an electromagnetic signal passed through the cavity resonator, and calculate a scattering parameter, a transmission means configured to supply the generated electromagnetic signal to the cavity resonator, a reception means configured to supply the electromagnetic signal passed through the cavity resonator to the network analyzer, and a calculation processor configured to receive the scattering parameter from the network analyzer and calculate a dielectric constant of the sample.


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