The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

May. 31, 2013
Applicants:

Thad G. Walker, Madison, WI (US);

Michael S. Larsen, Woodland Hills, CA (US);

Inventors:

Thad G. Walker, Madison, WI (US);

Michael S. Larsen, Woodland Hills, CA (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05H 3/02 (2006.01); H05H 3/04 (2006.01); G01P 15/00 (2006.01); G01P 15/093 (2006.01); G01P 15/18 (2013.01);
U.S. Cl.
CPC ...
G01P 15/006 (2013.01); G01P 15/093 (2013.01); G01P 15/18 (2013.01);
Abstract

One embodiment includes an accelerometer system. The accelerometer system can include a Far-Off Resonance Trap (FORT) control system configured to generate an optical trapping beam. The system can also include a FORT accelerometer detection system including a FORT that is configured to trap a cluster of atoms based on the optical trapping beam. The FORT accelerometer detection system can also include an interrogation system configured to determine motion of the cluster of atoms along at least one axis resulting from an external acceleration in the at least one axis based on a relative phase shift of an optical probe beam through the cluster of atoms. The system can further include an acceleration processor configured to calculate the external acceleration in the at least one axis based on the relative phase shift of the optical probe beam.


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