The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Aug. 25, 2011
Applicants:

Bhushan Sopori, Denver, CO (US);

Przemyslaw Rupnowski, Golden, CO (US);

Michael Ulsh, Broomfield, CO (US);

Inventors:

Bhushan Sopori, Denver, CO (US);

Przemyslaw Rupnowski, Golden, CO (US);

Michael Ulsh, Broomfield, CO (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/27 (2006.01); G01N 21/89 (2006.01); G01N 21/898 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 21/27 (2013.01); G01N 21/8901 (2013.01); G01N 21/898 (2013.01); G01N 21/9501 (2013.01);
Abstract

A monitoring systemcomprising a material transport systemproviding for the transportation of a substantially planar materialthrough the monitoring zoneof the monitoring system. The systemalso includes a line camerapositioned to obtain multiple line images across a width of the materialas it is transported through the monitoring zone. The systemfurther includes an illumination sourceproviding for the illumination of the materialtransported through the monitoring zonesuch that light reflected in a direction normal to the substantially planar surface of the materialis detected by the line camera. A data processing systemis also provided in digital communication with the line camera. The data processing systemis configured to receive data output from the line cameraand further configured to calculate and provide substantially contemporaneous information relating to a quality parameter of the material. Also disclosed are methods of monitoring a quality parameter of a material.


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