The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Jun. 30, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Keiichi Nomura, Honjo, JP;
Yohei Ishida, Honjo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/24 (2006.01); G01T 1/20 (2006.01); C23C 14/06 (2006.01); C23C 14/14 (2006.01); C23C 14/50 (2006.01);
U.S. Cl.
CPC ...
C23C 14/24 (2013.01); C23C 14/0694 (2013.01); C23C 14/14 (2013.01); C23C 14/505 (2013.01); G01T 1/20 (2013.01);
Abstract
A radiation imaging apparatus, comprising a sensor panel including a plurality of sensors arranged on a substrate and configured to detect light, and a scintillator placed over the sensor panel, wherein the scintillator having a concentric characteristics distribution having a center outside an outer edge of the scintillator.
Nomura, Keiichi. (2016). Radiation imaging apparatus, method of manufacturing the same, and radiation inspection apparatus (U.S. Patent No. 9234271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9234271
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile