The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Aug. 13, 2012
Hitomi Kaneko, Saitama, JP;
Tadashi Kitai, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Tadashi Kitai, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An inspection apparatus obtains a correction parameter for correcting the positional shift between a previously read image and a master image, and corrects one of a currently read image or a master image using the correction parameter for the previously read image, before comparing between the currently read image and the master image to detect the positional shift in the currently read image.