The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Jul. 07, 2011
Jian Rao, Shenzhen, CN;
Yonghua Zeng, Shenzhen, CN;
Dewei Chen, Shenzhen, CN;
Wusun Chen, Shenzhen, CN;
Jian Rao, Shenzhen, CN;
Yonghua Zeng, Shenzhen, CN;
Dewei Chen, Shenzhen, CN;
Wusun Chen, Shenzhen, CN;
EDAN INSTRUMENTS, INC., Shenzhen, CN;
Abstract
An apparatus and method for automatically identifying FHR baseline includes collecting FHR data within a preset duration to obtain an FHR data sequence h'(n); preprocessing the collected FHR data sequence h′(n) to obtain a corresponding FHR data sequence during the preprocessing; selecting a primary dominant peak value according to the frequency distribution of the corresponding FHR data sequence during the preprocessing; and identifying a dynamic baseline according to the corresponding FHR data sequence and the primary dominant peak value during the preprocessing to obtain the dynamic baseline, and display and print the dynamic baseline. The apparatus and method effectively prevents the impact caused by regular change of the FHR to the baseline solution, and accurately reflects the FHR baseline and changes thereof of a fetus under different conditions.