The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Apr. 11, 2012
Applicant:

Andrew B. Watson, Los Gatos, CA (US);

Inventor:

Andrew B. Watson, Los Gatos, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/004 (2013.01); H04N 17/00 (2013.01); H04N 17/002 (2013.01);
Abstract

A method of measuring the video acuity of a physical imaging system is disclosed. A chart comprising an image of a set of test symbols is provided. The set of test symbols comprises a plurality of symbols repeated at a plurality of symbol sizes. A digital image of the chart is obtained using the imaging system. The digital image is cropped to obtain a set of cropped images comprising individual digital images of each test symbol in the set of test symbols. A template image of a test symbol is aligned with a test image comprising one member of the set of cropped images. The template image comprises a digitally generated image of the test symbol in the test image. The normalized correlation between the aligned template image and the test image is determined. The test symbol whose template image has the highest correlation with the test image is identified.


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