The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Mar. 12, 2013
Applicants:

Benjamin D. Buckner, Irvine, CA (US);

Drew L'esperance, Irvine, CA (US);

Inventors:

Benjamin D. Buckner, Irvine, CA (US);

Drew L'Esperance, Irvine, CA (US);

Assignee:

MetroLaser, Inc., Laguna Hills, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/083 (2006.01); H04N 5/225 (2006.01); H04N 5/21 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
H04N 5/21 (2013.01); G01N 21/45 (2013.01);
Abstract

A Schlieren imaging system can comprise a digital display configured to provide a background for Schlieren imaging, a cutoff filter onto which the background is focused, and a camera configured to image the cutoff filter and the background to facilitate Schlieren imaging. A calibration method for the Schlieren imaging system can comprise forming a pixel image on a digital display, focusing the pixel image on the cutoff filter, imaging the cutoff filter and the pixel image with a camera; and moving the pixel image with respect to the cutoff filter to align the pixel image with respect to the cutoff filter to facilitate Schlieren imaging. Thus, alignment of the Schlieren imaging system can be substantially simplified.


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