The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Mar. 13, 2014
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Brian Lee Duke, Poway, CA (US);

Vijay S. Desai, San Diego, CA (US);

Paul C. Dulany, San Diego, CA (US);

Kannan Shashank Shah, San Diego, CA (US);

Assignee:

SAS INSTITUTE INC., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/20 (2013.01);
Abstract

This disclosure describes methods, systems, and computer-program products for determining classification rules to use within a fraud detection system The classification rules are determined by accessing distributional data representing a distribution of historical transactional events over a multivariate observational sample space defined with respect to multiple transactional variables. Each of the transactional events is represented by data with respect to each of the variables, and the distributional data is organized with respect to multi-dimensional subspaces of the sample space. A classification rule that references at least one of the subspaces is accessed, and the rule is modified using local optimization applied using the distributional data. A pending transaction is classified based on the modified classification rule and the transactional data.


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