The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Jun. 11, 2010
Sheetal Kalyani, Chennai, IN;
Lakshminarayanan Raghavendran, Chennai, IN;
Krishnamurthi Giridhar, Chennai, IN;
Sheetal Kalyani, Chennai, IN;
Lakshminarayanan Raghavendran, Chennai, IN;
Krishnamurthi Giridhar, Chennai, IN;
Centre of Excellence in Wireless Technology, Chennai, IN;
Abstract
A system and method for estimating a channel in wireless communication systems using Orthogonal Frequency Division Multiplexing (OFDM). From the received OFDM symbols, Maximum Likelihood (ML) estimate of the channel frequency response is obtained at the pilot locations. A hypothesis test is performed on the ML estimates and the outcome of the hypothesis test is used to decide a shrinkage target. Biased estimation methods are used to shrink the ML estimates towards the shrinkage target to obtain better estimates of the channel frequency response at the pilot locations and these estimates are interpolated using a Filter to get a set of complete estimates of the channel over the resource block. The Filter is an Empirical Weiner Filter or a robust 2D-MMSE filter and the biased estimation is done using either a James-Stein (JS) estimator or a shrinkage estimator or an empirical Bayes estimator.