The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Dec. 20, 2007
Ting-kuang Chiang, Saratoga, CA (US);
Prasad Paranjape, Fremont, CA (US);
Michael D. Jarchi, West Hills, CA (US);
Mallikarjun Chillal, San Jose, CA (US);
Ting-Kuang Chiang, Saratoga, CA (US);
Prasad Paranjape, Fremont, CA (US);
Michael D. Jarchi, West Hills, CA (US);
Mallikarjun Chillal, San Jose, CA (US);
Infinera Corporation, Sunnyvale, CA (US);
Abstract
Embodiments of the present invention analyze a plurality of parallel channels and identify specific channel(s) that have skew outside of an acceptable skew error margin. In certain embodiments, this skew is identified by determining the timing misalignment between a channel under test and a deskew channel. Other channels within the plurality of channels are masked by transmitting a repeating masked bit pattern. This timing misalignment may be measured by comparing a segment within the channel under test to a corresponding segment within the deskew channel and identifying a time differential between the two segments.