The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Jan. 06, 2014
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Dong Wei, Austin, TX (US);
Guozhu Long, Fremont, CA (US);
Jianhua Liu, Shenzhen, CN;
Guijin Xu, Shenzhen, CN;
Anni Wu, Shenzhen, CN;
Assignee:
Futurewei Technologies, Inc., Plano, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01); H04L 7/04 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04L 7/041 (2013.01); H04J 3/0638 (2013.01); H04J 3/0667 (2013.01); H04L 27/2656 (2013.01); H04L 27/2657 (2013.01); H04J 3/065 (2013.01); H04L 27/2675 (2013.01);
Abstract
An apparatus comprising a customer node configured to couple to an access node and to receive via a channel from the access node a time of day (TOD) value and a corresponding sample index (SNUM) value, wherein the TOD value and the SNUM value are used to estimate a second time of day (TOD') value based on a propagation delay of the channel (L-Delay), and wherein the TOD value and the TOD′ value are used to estimate a second SNUM value (SNUM′) based on L-Delay and a plurality of parameters.