The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Feb. 15, 2013
Applicant:

Sumitomo Metal Mining Co., Ltd., Tokyo, JP;

Inventors:

Katsuya Kase, Ehime, JP;

Yasutaka Kamata, Ehime, JP;

Hideo Sasaoka, Ehime, JP;

Tomomichi Nihei, Ehime, JP;

Takuya Yamauchi, Ehime, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/525 (2010.01); H01M 4/505 (2010.01); C01G 53/00 (2006.01);
U.S. Cl.
CPC ...
H01M 4/525 (2013.01); C01G 53/006 (2013.01); C01G 53/40 (2013.01); H01M 4/505 (2013.01); C01P 2006/11 (2013.01); C01P 2006/12 (2013.01); C01P 2006/40 (2013.01); C01P 2006/80 (2013.01);
Abstract

The present invention provides nickel-cobalt-manganese composite hydroxide and a method for manufacturing same, the nickel-cobalt-manganese composite hydroxide as a precursor allowing a positive electrode active material having excellent battery characteristics and a high-density to be manufactured. The nickel-cobalt-manganese composite hydroxide is represented by a general formula: NiCoMnM(OH)(wherein 0<x≦1/3, 0<y≦1/3, 0≦z≦0.1, and M is at least one element selected from Mg, Al, Ca, Ti, V, Cr, Zr, Nb, Mo, and W) and serves as a precursor of a positive electrode active material for nonaqueous electrolyte secondary batteries; wherein the specific surface area measured by a nitrogen adsorption BET method is 1.0 to 10.0 m/g, the carbon content measured by a high frequency combustion infrared absorption method is not more than 0.1% by mass, and the half-value width of a plane in X-ray diffraction is not more than 1.5°.


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