The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Dec. 10, 2014
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Kentaro Morimoto, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/34 (2006.01); H01J 49/02 (2006.01); H01J 49/00 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G01N 30/7233 (2013.01);
Abstract

There are provided a mass spectrometer and a mass spectrometry method which can realize shortening of the measurement time and reduction of the consumption of a sample. Ions, in which the intensity distribution forms a peak waveform at both of each retention time and each mass-to-charge ratio (peaks P, P, Pand P) are detected as MS/MS precursor ions based on three-dimensional information of a retention time, a mass-to-charge ratio and an intensity. Whether or not MSanalysis is performed for each ion is determined beforehand based on whether or not the isotopic distributions of a plurality of ions are superimposed at each retention time rtto rt. Ions (peaks Pand P) for which MSanalysis is performed and ions (peaks Pand P) for which MSanalysis is not performed can be hereby determined at the time the MS spectrum is measured to detect MS/MS precursor ions.


Find Patent Forward Citations

Loading…