The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Apr. 16, 2015
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventor:

Joo-Hyeon Lee, Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/04 (2006.01); G11C 17/16 (2006.01); G11C 17/18 (2006.01);
U.S. Cl.
CPC ...
G11C 29/78 (2013.01); G11C 17/16 (2013.01); G11C 17/18 (2013.01); G11C 29/04 (2013.01);
Abstract

A repair circuit includes a test data processing unit that outputs first and second fail detection signals using first and second test data of first and second memory banks, respectively, in response to a test mode signal, a repair address control unit that sets a priority of the first and second memory banks and selectively stores first and second addresses of the first and second memory banks based on the set priority in response to the first and second fail detection signals, and a fuse unit that performs repair programming based on the addresses selectively stored in the repair address control unit.


Find Patent Forward Citations

Lee, Joo-Hyeon. (2016). Repair circuit and semiconductor memory device including the same (U.S. Patent No. 9230693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9230693

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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