The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Aug. 09, 2012
Guang Hai Jin, Yongin, KR;
Jae-beom Choi, Yongin, KR;
Kwan-wook Jung, Yongin, KR;
June-woo Lee, Yongin, KR;
Seong-jun Kim, Yongin, KR;
Guang hai Jin, Yongin, KR;
Jae-Beom Choi, Yongin, KR;
Kwan-Wook Jung, Yongin, KR;
June-Woo Lee, Yongin, KR;
Seong-Jun Kim, Yongin, KR;
SAMSUNG DISPLAY CO., LTD., Yongin, Gyeonggi-Do, KR;
Abstract
A method for testing an array, by using an array testing device for detecting a voltage distribution formed on an array substrate, includes resetting pixel voltages of a plurality of pixel circuits formed on the array substrate with a predetermined voltage, detecting the voltage distribution of the array substrate, generating a correction value for correcting the voltage distribution of the array substrate, and measuring a threshold voltage of a driving transistor included in the plurality of pixel circuits formed on the array substrate by applying the correction value.