The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Sep. 26, 2012
Raytheon Company, Waltham, MA (US);
Valeri I. Karlov, Stony Brook, NY (US);
Adam C. Durst, Stony Brook, NY (US);
Patrick E. Barry, Port Jefferson, NY (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method for locating features in a field of view of an imaging sensor that includes receiving image data from the field of view of an imaging sensor, wherein the image data includes a plurality of image frames. The method also includes receiving three-dimensional position measurements, in an absolute coordinate system, for the imaging sensor at the point in time each image frame is acquired and identifying one or more features in each of the image frames. The method also includes determining position and velocity of the one or more features in the image frames based on changes to the one or more features between the image frames and determining three-dimensional positions of the one or more features in the image frames based on the received three-dimensional position measurements for the imaging sensor and position and velocity of the one or more features in the image frames.