The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Nov. 27, 2013
Applicant:

Semiconductor Components Industries, Llc, Phoeniz, AZ (US);

Inventors:

Robert A. Black, Milpitas, CA (US);

Jonathan Michael Stern, San Carlos, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G06T 5/00 (2006.01); H04N 5/217 (2011.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/008 (2013.01); G06T 7/0018 (2013.01); H04N 5/217 (2013.01); H04N 17/002 (2013.01);
Abstract

An imaging system may include a camera module with an image sensor having an array of image sensor pixels and one or more lenses that focus light onto the array. The system may include processing circuitry configured to mitigate flare artifacts in image data captured using the array based on at least one image flare map. The image flare map may identify a portion of the captured image data on which to perform image flare mitigation operations. The processing circuitry may perform image flare mitigation operations such as pixel value desaturation on the identified portion of the captured image data without desaturating portions of the image data that do not include flare artifacts. The flare map may be generated using a calibration system that characterizes the location, intensity, and color of all possible image flare artifacts that may be generated by the imaging system during normal imaging operations.


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