The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Sep. 20, 2013
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hiromichi Yamada, Tokyo, JP;

Tsutomu Yamada, Tokyo, JP;

Nobuyasu Kanekawa, Tokyo, JP;

Kesami Hagiwara, Kanagawa, JP;

Yuichi Ishiguro, Kanagawa, JP;

Takashi Yasumasu, Kanagawa, JP;

Kazuyoshi Fukuda, Kanagawa, JP;

Yoshiyuki Nakada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06F 11/14 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2215 (2013.01); G06F 11/07 (2013.01); G06F 11/141 (2013.01);
Abstract

To have a problem of occurrence of the same failure in failure detection of a microcontroller. A microcontroller has a CPU and a data access control circuit. The data access control circuit performs two types of accesses: an individual access in which a data access of the CPU is performed for each thread, and a shared access in which a data access of the CPU is performed by executing two threads. The data access control circuit detects a failure of the CPU by making a comparison between the command and the address, respectively, in the shared access generated by executing the two threads.


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