The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Sep. 25, 2013
Emc Corporation, Hopkinton, MA (US);
Ao Ma, Palo Alto, CA (US);
Windsor W. Hsu, San Jose, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Techniques for determining a disk failure indicator for predicting disk failures are described herein. According to one embodiment, diagnostic parameters are received which are collected from a set of known working disks and a set of known failed disks of a storage system. For each of the diagnostic parameters, a first quantile distribution representation is generated for the set of known working disks, and a second quantile distribution representation is generated for the set of known failed disks. The first quantile distribution representation and the second quantile distribution representation of each of the diagnostic parameters are then compared to select one or more of the diagnostic parameters as one or more disk failure indicators for predicting future disk failures.