The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Mar. 08, 2013
Yukio Itami, Kanagawa, JP;
Tadashi Nakamura, Tokyo, JP;
Yukio Itami, Kanagawa, JP;
Tadashi Nakamura, Tokyo, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An optical scanning device includes a plurality of scanning optical systems that focus light beams deflected by an optical deflector onto corresponding scanning surfaces. The systems include a first scanning optical system and a second scanning optical system. The first scanning optical system and the second scanning optical system are disposed respectively at each side of a plane including a rotation axis of a polygonal-mirror optical deflector. Each of the scanning optical systems includes a synchronous detection optical system that determines a timing to start scanning the scanning surfaces with the light beams. When a time from the end of an effective scanning area in the second scanning optical system to synchronous detection in the first scanning optical system is Ta, and a time from the end of an effective scanning area in the first scanning optical system to synchronous detection in the second scanning optical system is Tb, Ta>Tb.