The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Jul. 08, 2014
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Tomonori Matsushita, Chino, JP;

Tatsuo Urushidani, Chino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G02B 26/00 (2006.01); G01J 3/26 (2006.01);
U.S. Cl.
CPC ...
G02B 26/001 (2013.01); G01J 3/26 (2013.01);
Abstract

An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength λ1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength λ2 different from the first wavelength as a center wavelength.


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