The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Jul. 12, 2010
Masafumi Oshiro, Hamamatsu, JP;
Yuichi Toyoda, Hamamatsu, JP;
Yoshinori Hashimoto, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An image acquisition apparatusA includes a sample stagefor placing a sample S thereon, an image pickup devicecapable of acquiring a two-dimensional image and TDI driving, an image pickup optical systemincluding an objective lens, a scanning unit for acquiring an observation image while scanning the sample S by the image pickup deviceand the image pickup optical system, and a focus oscillation control devicefor controlling oscillation of a focus in the sample S so that an image pickup focus in the sample S oscillates at an oscillation frequency fs in an optical axis direction. The focus oscillation control devicesets the oscillation frequency fs so that the oscillation frequency fs substantially coincides with Ns times (Ns is an integer not less than 1) the basic frequency, which is a reciprocal 1/Ti of an image pickup period Ti of TDI driving in the image pickup device. Thus, an image acquisition apparatus capable of efficiently acquiring an observation image with focus extended can be realized.