The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

May. 03, 2012
Applicants:

Herschel A. Ainspan, New Hempstead, NY (US);

Seongwon Kim, Old Tappan, NJ (US);

Franco Stellari, Waldwick, NJ (US);

Alan J. Weger, Mohegan Lake, NY (US);

Inventors:

Herschel A. Ainspan, New Hempstead, NY (US);

Seongwon Kim, Old Tappan, NJ (US);

Franco Stellari, Waldwick, NJ (US);

Alan J. Weger, Mohegan Lake, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01); G01R 31/26 (2014.01); H03K 19/094 (2006.01); H03K 19/14 (2006.01);
U.S. Cl.
CPC ...
G01R 31/26 (2013.01); H03K 19/094 (2013.01); H03K 19/14 (2013.01);
Abstract

PICA test methods are shown that includes forming semiconductor devices having proximal light emitting regions, such that the light emitting regions are grouped into distinct shapes separated by a distance governed by a target resolution size; forming logic circuits to control the semiconductor devices; activating the one or more semiconductor devices by providing an input signal; and suppressing light emissions from one or more of the activated semiconductor devices by providing one or more select signals to the logic circuits.


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