The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Feb. 25, 2011
Applicant:
Christopher Ryan Moon, Cupertino, CA (US);
Inventor:
Christopher Ryan Moon, Cupertino, CA (US);
Assignee:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01); B82Y 35/00 (2011.01); G01Q 10/06 (2010.01); G01Q 60/36 (2010.01); G01Q 10/00 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/24 (2013.01); B82Y 35/00 (2013.01); G01Q 10/00 (2013.01); G01Q 10/065 (2013.01); G01Q 60/363 (2013.01);
Abstract
A method for determining a loop response for an apparatus for an atomic force microscope is disclosed. The method comprises: determining a loop response for an on-surface movement of a cantilever over a frequency range; determining a loop response for an off-surface movement of the cantilever over the frequency range; and adjusting an output of the controller at a frequency based on the loop response for the off-surface movement. An atomic force microscopy system is disclosed.