The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Dec. 23, 2010
Applicant:

Nobuhiro Kitagawa, Akashi, JP;

Inventor:

Nobuhiro Kitagawa, Akashi, JP;

Assignee:

SYSMEX CORPORATION, Kobe-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/04 (2006.01); G01N 35/00 (2006.01); G01N 1/31 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 35/04 (2013.01); G01N 1/312 (2013.01); G01N 2035/0094 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/0415 (2013.01); G01N 2035/0462 (2013.01); G01N 2035/0472 (2013.01);
Abstract

A transport apparatus includes: a first transport line configured to transport a rack downstream along the transporting route; a second transport line configured to transport the rack upstream along the transporting route; and a controller including a processor and a memory that stores programs executable by the processor to: determine where to transport a post-tested rack according to whether or not retesting is necessary on any sample held in the post-tested rack; and according to a determination, instruct the transport apparatus to transport the post-tested rack selectively (i) along the first transport line either back to first sample processing unit, where the rack has been tested, or to a second sample processing unit located downstream of the first sample processing unit, or (ii) along the second transport line back from the first sample processing unit.


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