The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Aug. 01, 2014
Applicant:

Gii Acquisition, Llc, Davisburg, MI (US);

Inventors:

Nathan Andrew-Paul Kujacznski, Flint, MI (US);

James W. St. Onge, Bloomfield Hills, MI (US);

Michael G. Nygaard, Fenton, MI (US);

Assignee:

GII ACQUISITION, LLC, Davisburg, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/00 (2006.01); G01N 21/89 (2006.01); B07C 5/342 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/89 (2013.01); B07C 5/342 (2013.01); B07C 5/3422 (2013.01); G01N 21/8901 (2013.01); G01N 2021/845 (2013.01);
Abstract

A high-speed method and system for inspecting a stream of parts using at least one transparent traveling carrier of a conveyor subsystem are provided. The subsystem has a forward reach and a return reach. The method includes controllably receiving a stream of parts in rapid succession on the at least one traveling carrier and utilizing the subsystem to transfer the stream of parts in rapid succession to a part inspection station. The bottom surface of each part is illuminated through its traveling carrier with radiant energy when the part is located at the inspection station to generate reflected radiation signals which travel through its traveling carrier. A bottom image of each illuminated bottom surface is formed from the reflected radiation signals at an imaging location between the forward and return reaches at the inspection station. The bottom images are detected at the imaging location.


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