The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Nov. 14, 2013
Applicant:
Nokia Corporation, Espoo, FI;
Inventors:
Antti Salo, Lohja, FI;
Matti Kosonen, Jarvenpaa, FI;
Assignee:
Nokia Technologies Oy, Espoo, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/04 (2006.01); G01L 1/14 (2006.01); G01L 1/12 (2006.01); G06F 3/0487 (2013.01); G06F 1/16 (2006.01); G06F 3/01 (2006.01); G06F 3/041 (2006.01); H04M 1/02 (2006.01); G01B 7/16 (2006.01);
U.S. Cl.
CPC ...
G01L 1/04 (2013.01); G01B 7/16 (2013.01); G01L 1/12 (2013.01); G01L 1/14 (2013.01); G01L 1/142 (2013.01); G06F 1/1626 (2013.01); G06F 1/1641 (2013.01); G06F 1/1652 (2013.01); G06F 3/017 (2013.01); G06F 3/0414 (2013.01); G06F 3/0487 (2013.01); H04M 1/0268 (2013.01); G06F 2203/04102 (2013.01); G06F 2203/04105 (2013.01);
Abstract
Monitoring deformation of a flexible electronic apparatus. Changes in space within the apparatus between at least two measurement points are detected; and degree of deformation of the apparatus is determined based on the detected changes in the space within the apparatus between the at least two measurement points.