The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Jul. 30, 2014
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Ludovic Angot, Hsinchu, TW;

Chuan-Chung Chang, Zhubei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/14 (2006.01); G06K 9/46 (2006.01); G01S 1/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01S 1/00 (2013.01); G06K 9/4604 (2013.01); G06T 7/0065 (2013.01);
Abstract

A method and a system for measuring a distance from a reference point to an object are provided. The method comprises the following steps. At least one image of an object is captured through a lens comprising a phase mask composed of a parallel plate and a wedge prism. At least two corresponding regions of interest (ROI) are obtained from the images. The regions of interest correspond to identical portions of the object. The relative coordinates between corresponding locations within the corresponding regions of interest is measured. The distance is calculated according to the relative coordinates.


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