The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Jun. 28, 2013
Applicant:

The Procter & Gamble Company, Cincinnati, OH (US);

Inventors:

Raymond Scott Hamilton, Lebanon, OH (US);

Mark Mason Hargett, Liberty Township, OH (US);

Tina Brown, Cincinnati, OH (US);

Assignee:

The Procter & Gamble Company, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61F 13/49 (2006.01); A61F 13/15 (2006.01);
U.S. Cl.
CPC ...
A61F 13/15699 (2013.01); A61F 13/15593 (2013.01); A61F 13/49011 (2013.01); A61F 13/49012 (2013.01); A61F 2013/49028 (2013.01); B32B 2555/02 (2013.01); B65H 2801/57 (2013.01); Y10T 156/1011 (2015.01); Y10T 156/1015 (2015.01); Y10T 156/1052 (2015.01);
Abstract

A first elastic material is advanced in a machine direction in a stretched state to a first metering device at a speed, V. A second elastic material is advanced in the machine direction in a stretched state to a second metering device at a speed, V. First and second substrate layers are advanced in a machine direction to a third metering at a speed, V, along with the first and second elastic materials. The first and second elastic materials are bonded to the first and second substrate layers at the third metering device to form a layered elastic substrate. The layered elastic substrate is advanced to a fourth metering device at a speed, V. Vis less than V, Vis greater than Vand V, Vis less than V, and Vis greater than Vand V


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