The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Dec. 10, 2012
Rodenstock Gmbh, Munich, DE;
Wolfgang Becken, Munich, DE;
Helmut Altheimer, Baiswell-Lauchdorf, DE;
Gregor Esser, Munich, DE;
Andrea Welk, Munich, DE;
Matthias Nähring, Munich, DE;
Stephan Trumm, Munich, DE;
Rodenstock GmbH, Munich, DE;
Abstract
The determination of objective refraction data for an eye of a spectacle wearer, wherein based on measured data for the eye of the spectacle wearer, which determine at least one first set of Zernike coefficients of a wave front aberration for a long accommodation and a second set of Zernike coefficients of a wave front aberration for a short accommodation of the eye, objective refraction data for sphere (Sph), cylinder (Cyl) and axis position (Axis) of the eye for close viewing is determined such that the objective refraction data satisfies equations for a corrected power vector Pfor near viewing, wherein said corrected power vector Pcorresponds, based on a difference between a first power vector and a second power vector when ΔM>A; and when ΔM≦A,wherein is the spherical equivalent of a predetermined object distance d for close viewing.